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Fundamentals of Analog Microelectronic Techniques

X403 (1 semester unit in EE)

An elective in the Professional Sequence in Integrated Circuit Design and Techniques

Develop intuitive skills for analyzing microelectronic circuits without doing lots of intricate mathematics. While some courses use the classical approach requiring a tedious derivation that becomes more cumbersome with a complex circuit, this approach offers an alternative, focusing on the analysis-by-inspection method. Topics covered include: low-frequency BJT and MOS amplifiers, amplifier frequency response, analysis-by-inspection, SPICE simulation, and advanced case studies. Note: this course features an English language web presentation accompanied by both an English language or Mandarin language soundtrack. The student can choose either soundtrack option at any time during the course. Mandarin-speaking students with limited English language skills may successfully complete the course.

Course outline:

Low-frequency BJT Amplifiers

AC Analysis of Bipolar Common-Emitter Amplifier
AC Analysis of Bipolar Emitter Follower
AC Analysis of Bipolar Common-Base Amplifier

Low-frequency MOS Amplifiers

AC Analysis of MOS Discrete-Circuit Amplifiers
Analysis of CMOS Amplifiers

Amplifier Frequency Response

Analysis of an Amplifier at High Frequencies
Advanced High-Frequency Analysis of Common-Source Amplifiers
Conventional vs. Analysis-by-Inspection Methods at Low Frequencies

Frequency Response: Analysis by Inspection

Analysis-by-Inspection Methods in High and Low Frequencies
Analysis-by-Inspection: Wideband Single-Stage Amplifier
Useful Compound Configurations for Wideband Applications

Case Studies

Case Study: Advanced Analysis on Output Admittance
Case Study: Poles vs. Zeros of Amplifiers

Click below for sections, start dates, locations, instructors,
and to enroll.

Online, Enroll anytime (Mandarin soundtrack only)